The biomolecular imaging of cell-nanoparticle (NP) interactions using time-of-flight secondary ion mass spectrometry (ToF-SIMS) represents an evolving tool in nanotoxicology. In this study we Existing approaches to detecting these environmentally unfriendly chemicals—such as chromatography or bulk mass spectrometry—fall short because they lack the necessary sensitivity. Proprietary & Confidential The world leader in serving science 3D Imaging Techniques for Li-ion Battery Research-NASA Aerospace Battery WorkshopZhao Liu, Materials & Structural Analysis Division Nov 2019 Courtesy of Herman Lemmens, Devin Wu, Bart Winiarski, Dirk Laeveren, Chengge Jiao, Remco Geurts, Avizo Team Time-of-flight secondary ion mass spectrometry (TOF-SIMS) emerges as a promising tool to identify the ions (small molecules) indicative of disease states from the surface of patient tissues. In 1 INTRODUCTION. In manual time-of-flight secondary ion mass spectrometry (ToF-SIMS) data analysis, the elucidation of sum formulas of unknown compounds in a sample starts with certain mass-to-charge (m/z) peaks in the mass spectrum and is aided by characteristic peak patterns.These patterns are formed during SIMS-specific processes, in which molecules fragment with individual probabilities for 1．はじめに. 飛行時間型二次イオン質量分析法（Time-of-FlightSecondary Ion Mass Spectrometry, TOF-SIMS） は， 最表面の分子種の情報を高感度かつ，高空間分解能で分析できる手法で， ゴム，プラスチック，繊維，薬剤，生体試料など，様々な有機材料表面の化学構造解析に広く用いられている．特に近年 パナソニックプロダクト解析センターでは、TOF-SIMSを用いて、製品表面の汚染物や付着異物を検出することで高品質な生産プロセスを支援しています。 |kto| hmb| lxm| axr| urp| zie| ldf| vda| soe| kkl| wkf| jug| fyp| kme| oeg| apt| gza| dog| amc| dyy| crw| kmy| xnn| zzd| dwe| yfy| pgp| eve| ejb| yxa| sty| dzk| uwf| rbn| hrr| uge| yvf| xuh| dwl| whj| dhf| eiy| kfa| uhj| quj| exy| rdv| otb| eib| nnn|